Showing results: 1336 - 1350 of 2684 items found.
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42-514-106 -
Pickering Interfaces Ltd.
The 40-514-106 (PXI) and 42-514-106 (PXIe) are low density multiplexers in quad 6-channel, 1-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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40-514-107 -
Pickering Interfaces Ltd.
The 40-514-107 (PXI) and 42-514-107 (PXIe) are low density multiplexers in dual 12-channel, 1-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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40-514-106 -
Pickering Interfaces Ltd.
The 40-514-106 (PXI) and 42-514-106 (PXIe) are low density multiplexers in quad 6-channel, 1-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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40-514-103 -
Pickering Interfaces Ltd.
The 40-514-103 (PXI) and 42-514-103 (PXIe) are low density multiplexers in quad 3-channel, 2-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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42-514-102 -
Pickering Interfaces Ltd.
The 40-514-102 (PXI) and 42-514-102 (PXIe) are low density multiplexers in single 6-channel, 4-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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42-514-103 -
Pickering Interfaces Ltd.
The 40-514-103 (PXI) and 42-514-103 (PXIe) are low density multiplexers in quad 3-channel, 2-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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40-514-104 -
Pickering Interfaces Ltd.
The 40-514-104 (PXI) and 42-514-104 (PXIe) are low density multiplexers in dual 6-channel, 2-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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RMAC-VME -
Abaco Systems Inc
Designed for laboratory simulation and production test applications, the Modular Avionics Controller (RMAC) is an intelligent, high performance 6U VME product supporting ARINC protocols and other serial communications. As an evolutionary follow-on product to the successful VME-AIC product line, the RMAC-VME provides a single integrated interface to multiple avionics protocols on VMEbus platforms.
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PCE-CPT 20 -
PCE Instruments
PCE-CPT 20 is a cupping tester, or coating flexibility tester, used for testing the adhesion, elongation and deformability of paints, lacquers, varnishes, powder coatings and other surface coatings on metal sheets. Used in manufacturing production, paint shop and quality control applications, the PCE-CPT 20 cupping tester aids in determining coating strength, durability and elasticity. A mandatory test in Qualicoat and QIB accredited quality control laboratories, a cupping test, also referred to as an Erichsen test or dent test, uses a spherical punch to deform a sample. This deformation results in a cup-like bulge. When using the PCE-CPT 20 to perform a cupping test in accordance with the ISO 1520 standard, the sample should be placed coating side up so that the 20 mm spherical punch presses against the uncoated underside of the metal sheet. The cupping test is terminated when small cracks and/or detachments are observed on the bulged part of the sample. The PCE-CPT 20 cupping tester's easy-to-read display shows the bulge deformation distances that can be used to determine the coating's flexibility rating.
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8800 Family -
Delaire USA, Inc.
Delaire USA qualification test systems are designed to act as worst-case links for bandwidth/dispersion and attenuation, or to meet the customer's loss, dispersion, and distance requirements for custom applications. Because the test links are constructed from hand-selected, industry-standard fiber and not simulated with dispersion elements, all of the effects including loss, dispersion, and fiber nonlinearities are present and authentic. Typical applications include optical transciever testing and qualification for 40G AND 100G systems
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ETH -
ENGMATEC GmbH
The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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SL1720A -
Keysight Technologies
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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X-COM Systems
Our Components product line consists of standard RF components and unique designs for custom microwave applications. We provide rugged, reliable and quality solutions for low and high power attenuation, termination, coupler, and power-divider applications. In addition to our extensive line of standard products, Bird has a reputation for designing custom solutions for custom applications. Bird has done hundreds of special versions of RF components to meet the unique needs of our customers. Common requests for customization include: Special Connectors, Non-Standard Attenuation Values, Mismatch Loads, Exceptional Peak or Average Power Handling Capability, Extremely Low VSWR Requirements, Custom Test Requirements and many others!
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NX5000 Series -
Marvin Test Solutions, Inc.
ROM emulation is a powerful and versatile method of microprocessor testing. ROM emulation has emerged as the technique of choice for microprocessor test and diagnostic applications. A microprocessor-based board is tested by replacing the boot ROMs on the Unit Under Test (UUT) with memory emulation pods. Each pod handles eight bits of the data bus. Processors from 8 to 32 bits can be controlled with one to four pods (even the most advanced CPUs such as the Intel Pentium generally use only an eight-bit boot path). The emulator takes control of the UUT by resetting the processor and, under the test program’s control (monitor program), exercises all functions on the board. Synchronization with the UUT is automatic and requires no additional hardware or connections.
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Curtiss-Wright Defense Solutions
From miniature avionics bus recorders to high-speed, high-capacity units with customizable interfaces, we use our decades of experience designing and manufacturing flight test and monitoring recorders to deliver solutions that meet the newest standards. All recorders feature solid-state media (integrated or removable), tightly integrated replay and analysis software, and industry-leading technology, and can be used seamlessly with our aerospace instrumentation test and monitoring product line. They can record data in a variety of formats, including DARv3, Chapter 10, iNET-X, IENA, and PCAP, and are proven in-ground, flight, and space applications, such as flight test, mission recording, aircraft engine monitoring, health and usage monitoring (HUMS), and aircraft condition monitoring systems (ACMS).